Transmission Electron Microscope

The Transmission Electron Microscope is used to determine structural features of a variety of materials, including crystal structure, interfaces, defects, and chemical identification. The specific equipment is the Tecnai G2 F30 S-TWIN TEM, which can characterize ceramics, metals, semiconductors, and biological materials, including radioactive materials, at resolutions down to atomic scale, 0.2 nm. The system allows chemical analysis with spatial resolution of 1-2 nm. The TEM facility can also assist users in the preparation of samples suitable for analysis.

The HRC TEM facility provides high-resolution imaging services to internal and external customers on a fee basis.

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The Tecnai G2 F30 S-TWIN TEM is a perfect high-end analytical laboratory tool with excellent and versatile capabilities for high resolution imaging as well as extremely good analytical performance. Ultra-stable high-tension technology ensures reliable and excellent long-term energy stability for electron energy-loss experiments. This technology provides researchers with the ability to characterize materials at resolutions down to atomic scale (point-to-point resolution = 2 Ångström = 0.2 nm). The Technai F-30 S-TWIN STEM/TEM microscope is operating at 300 kV using a field emission gun in Schottky mode as an electron source. It provides the highest possible resolution of the electron transfer function and of structural features of the material. Magnifications of typically one million times or higher can be achieved. The system allows qualitative chemical analysis with special resolutions of 10 nm using energy disperse X-ray spectroscopy (EDS), parallel energy loss spectroscopy (PEELS), and energy-filtered electron microscopy (EFTEM). The Technai F-30 serves as a versatile tool to satisfy the needs of high-resolution microscopy in materials science on non-radioactive and radioactive materials.