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| At the heart of EMiL is a fully equipped JEOL electron probe microanalyzer (EPMA) model JXA-8900 and JEOL scanning electron microscope model JSM-5610 . The JXA-8900 is optimized for quantitative, non-destructive chemical analysis of solid materials on the submicron scale. The JXA-8900 is equipped with backscattered electron, secondary electron, and cathodoluminescence detectors capable of producing "real time" images, or automated images in tandem with x-ray mapping to further characterize the area of interest. The JSM-5610 optimized for imaging submicron scale topography. The JSM-5610 is equipped with secondary and backscattered electron detectors and an Oxford ISIS EDS system, capable of qualitative, pseudo-quantitative analyses, and x-ray mapping. Supporting the EPMA and SEM is a state of the art sample preparation facility which is capable of preparing any sample for analysis/imaging. | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||